Que faire d'un disque dur mort ?

Warranty Status: Active

Heureusement que tu ne l'as pas ouvert !

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A+

On Wed, 27 Jun 2007 19:13:32 +0200, "Yannick P."
<jean.pal.le.mechant.spam@la.mechante.poste.net> wrote:

Vous avez essayé le programme de diag samsung ?

http://www.samsung.com/Products/HardDiskDrive/utilities/hutil.htm

Oui et il m'a dit qu'il y avait des erreurs avant même que je ne fasse un
formatage de bas niveau.

Quoi comme erreur ?
--
Vous voulez un conseil ?
Ne faites jamais confiance à ceux qui vous donnent des conseils.(c)

On Wed, 27 Jun 2007 19:13:32 +0200, "Yannick P."
<jean.pal.le.mechant.spam@la.mechante.poste.net> wrote:

Vous avez essayé le programme de diag samsung ?

http://www.samsung.com/Products/HardDiskDrive/utilities/hutil.htm

Oui et il m'a dit qu'il y avait des erreurs avant même que je ne fasse un
formatage de bas niveau.

Quoi comme erreur ?

Des blocs défectueux (« LBA »), je crois, il ne donnait pas vraiment de
détails. Après le formatage de bas niveau, il m'a dit carrément « contactez
Samsung pour retourner le matériel » ou quelque chose comme ça.

Ce disque perdait fréquemment des données.

Par curiosité, le résultat d'un smartctl -a :

smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION == Model Family: SAMSUNG SpinPoint P80 series
Device Model: SAMSUNG SP1614C
Serial Number: S01XJ10Y253685
Firmware Version: SW100-34
User Capacity: 156 601 105 920 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Tue Jun 26 20:34:56 2007 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION == SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (6000) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 100) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail
Always - 0
3 Spin_Up_Time 0x0007 100 100 025 Pre-fail
Always - 5696
4 Start_Stop_Count 0x0032 100 100 000 Old_age
Always - 854
5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail
Always - 0
8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail
Offline - 0
9 Power_On_Half_Minutes 0x0032 099 099 000 Old_age
Always - 6603h+38m
10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail
Always - 0
11 Calibration_Retry_Count 0x0012 100 100 000 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 852
194 Temperature_Celsius 0x0022 148 088 000 Old_age
Always - 30
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age
Always - 248
196 Reallocated_Event_Count 0x0032 098 098 000 Old_age
Always - 6
197 Current_Pending_Sector 0x0012 100 100 000 Old_age
Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age
Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 051 Old_age
Always - 0

SMART Error Log Version: 1
ATA Error Count: 37 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DDÚys, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 37 occurred at disk power-on lifetime: 5490 hours (228 days + 18
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 fe fe d6 e3 a0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 05 fe fe d6 e3 a0 00 04:08:05.563 SET FEATURES [Enable APM]
e7 d0 00 fe d6 e3 a0 00 04:08:05.563 FLUSH CACHE
b0 d0 00 00 4f c2 a0 00 04:00:29.750 SMART READ DATA
b0 da 00 00 4f c2 a0 00 04:00:29.563 SMART RETURN STATUS
b0 d0 00 00 4f c2 a0 00 03:00:29.625 SMART READ DATA

Error 36 occurred at disk power-on lifetime: 5468 hours (227 days + 20
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 fe b6 df fe a0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 05 fe b6 df fe a0 00 04:28:59.688 SET FEATURES [Enable APM]
e7 d0 00 b6 df fe a0 00 04:28:59.500 FLUSH CACHE
b0 d0 00 00 4f c2 a0 00 04:00:29.500 SMART READ DATA
b0 da 00 00 4f c2 a0 00 04:00:29.375 SMART RETURN STATUS
b0 d0 00 00 4f c2 a0 00 03:00:29.375 SMART READ DATA

Error 35 occurred at disk power-on lifetime: 5460 hours (227 days + 12
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 fe 68 34 f4 a0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 05 fe 68 34 f4 a0 00 00:41:27.188 SET FEATURES [Enable APM]
e7 d0 00 68 34 f4 a0 00 00:41:27.188 FLUSH CACHE
b0 d0 00 00 4f c2 a0 00 00:25:43.188 SMART READ DATA
b0 da 00 00 4f c2 a0 00 00:25:43.125 SMART RETURN STATUS
ef 03 46 01 10 00 a0 00 00:00:07.250 SET FEATURES [Set transfer
mode]

Error 34 occurred at disk power-on lifetime: 5460 hours (227 days + 12
hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 fe 00 08 4b a0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 05 fe 00 08 4b a0 00 00:34:54.125 SET FEATURES [Enable APM]
e7 d8 00 00 08 4b a0 00 00:34:54.125 FLUSH CACHE
b0 d8 00 00 4f c2 a0 00 00:00:29.875 SMART ENABLE OPERATIONS
b0 da 00 00 4f c2 a0 00 00:00:29.813 SMART RETURN STATUS
b0 d8 00 00 4f c2 a0 00 00:00:29.813 SMART ENABLE OPERATIONS

Error 33 occurred at disk power-on lifetime: 5455 hours (227 days + 7 hours)
When the command that caused the error occurred, the device was active or
idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 fe 90 01 f4 a0 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 05 fe 90 01 f4 a0 00 02:37:04.875 SET FEATURES [Enable APM]
e7 d0 00 90 01 f4 a0 00 02:37:04.875 FLUSH CACHE
b0 d0 00 00 4f c2 a0 00 02:00:29.375 SMART READ DATA
b0 da 00 00 4f c2 a0 00 02:00:29.250 SMART RETURN STATUS
b0 d0 00 00 4f c2 a0 00 01:00:29.375 SMART READ DATA

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]


Device does not support Selective Self Tests/Logging